Abstract
The results of theoretical analysis of the interference pattern created by an X-ray multilens interferometer in the case of an arbitrary number of planar compound refractive lenses are presented. The full widths at half maximum of the resonance peaks in the transverse and longitudinal directions relative to the direction of synchrotron radiation are calculated at distances corresponding to the fractional Talbot effect. A relation between the widths is shown to exist that is very close to the width relation in the case of focusing by a single lens. A difference between the fractional and full Talbot effects is discussed, and the necessary conditions for the transverse and longitudinal coherence of radiation are analyzed, the satisfaction of which guarantees that undistorted interference peaks will be observed experimentally.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
