Abstract
Thermoelectric materials and devices have wide applications in micro/nano-structured materials and structures. Under the time-varying thermal loadings, the thermoelectric devices can failure by fatigue accumulation. Fatigue crack propagations at the interface of the thermoelectric pn-junction and at the interface between the thermoelectric layer and the elastic substrate are analyzed in this paper. Influence of the temperature dependence of material properties on the fatigue life is discussed. The fatigue crack is more prone to propagation at the interface between thermoelectric layer and substrate rather than at the interface of the thermoelectric pn-junction. The fatigue life gradually increases to a constant with the external electrical resistance. Fatigue lives of the thermoelectric devices with temperature-dependent material properties are much shorter than those with constant material properties. A simplified but useful expression of the fatigue life as functions of the thermal loadings and the crack length is presented.
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