Abstract
It was established at the beginning of the 21st century that the critical resolved shear stress of small-sized (diameter from 50nm to 10 μm) metallic crystals fabricated from bulk crystals increases drastically with decreasing specimen diameter. Dou and Derby [Scr. Mater. 61, 524 (2009)SCMAF71359-646210.1016/j.scriptamat.2009.05.012] showed that, the critical shear stresses of small-sized single crystals of various fcc metals obeyed a universal power law of specimen size with an exponent of -0.66. In this study, we succeeded in reproducing almost perfectly the above universal relation without any adjustable parameters, based on a deformation process controlled by the operation of single-ended dislocation sources.
Highlights
It has long been known that thin crystals of whiskers exhibit anomalously high strengths with decreases in diameter, e.g., Ref. [1]
Shin Takeuchi,1 Keiichi Edagawa,2 and Yasushi Kamimura 2,*. It was established at the beginning of the 21st century that the critical resolved shear stress of small-sized metallic crystals fabricated from bulk crystals increases drastically with decreasing specimen diameter
Many systematic experiments on the size dependence of the critical resolved shear stresses (CRSSs) of small-sized specimens were performed until the end of the first decade of the 21st century; see the early review by Greer [4], a comprehensive review by Greer and De Hosson [5], and a recent review by Shahbeyk et al [6]
Summary
It has long been known that thin crystals of whiskers exhibit anomalously high strengths with decreases in diameter, e.g., Ref. [1]. Theoretical Justification of Single-Ended Dislocation-Source-Controlled Deformation of Micropillar fcc Crystals
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