Theoretical comparison of lattice parameter and particle size determination of pure tin oxide nanoparticles from powder X-ray diffraction

Abstract

SnO2 is an n-type semiconductor and a transparent conducting oxide and has apt properties in a gas sensing material, photovoltaic cells, fuel cells, batteries etc., Nanocrystalline tin oxide (SnO2) powders with different grain sizes were prepared by chemical co-precipitation method. Synthesised nanopowder XRD data were analyzed with different tools. X-ray diffraction (XRD) analysis mainly used to determine the crystal structure of nanomaterials such as ZnO, CuO, CdO and SnO2, etc., Pure SnO2 test conditions were set to be Cu-Kα XRD source, accelerating voltage 40 kV, acceleration currency 40 mA, scan range 20–80° with Ni filter (λ = 0.154056 nm). The pure SnO2 sample was exhibiting different crystalline peaks from the powder XRD study. The diffraction peak of pure tin oxide nanoparticles possesses a tetragonal rutile structure with space group P42/mnm. The FULLPROF Suite program was used for Rietveld–type analysis for pure SnO2powder diffraction data. The resultant data were compared with Nelson-Riley, Williamson-Hall plot, and Debye-Scherer methods. The lattice parameters and particle size of pure SnO2were agreed with the ICDD.No.01-077-0447data. The main advantages of these methods are low angle regions and a small number of peaks needed.