Abstract
Beam characterizations at the Canadian Light Source (CLS) are provided by two independent diagnostic beamlines called the optical synchrotron radiation (OSR) and the X-ray synchrotron radiation (XSR) beamlines, respectively. The XSR beamline, which operates in the X-ray region, is the subject of this report. The beamline is comprised of a variable-aperture pinhole camera with an intrinsic r.m.s. resolution at the source point of σ≈11 μm. Image analysis employs a Fresnel-based algorithm that encompasses both geometric and diffractive aspects within a common framework. Other instruments on the XSR beamline include a position-sensitive detector (PSD) and an Avalanche photodiode (APD). A fill-pattern monitor based on the APD has a bunch-charge resolution of at least 1 part in 10 7.
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