The X-ray diagnostic beamline at the Canadian Light Source

Abstract

Beam characterizations at the Canadian Light Source (CLS) are provided by two independent diagnostic beamlines called the optical synchrotron radiation (OSR) and the X-ray synchrotron radiation (XSR) beamlines, respectively. The XSR beamline, which operates in the X-ray region, is the subject of this report. The beamline is comprised of a variable-aperture pinhole camera with an intrinsic r.m.s. resolution at the source point of σ≈11 μm. Image analysis employs a Fresnel-based algorithm that encompasses both geometric and diffractive aspects within a common framework. Other instruments on the XSR beamline include a position-sensitive detector (PSD) and an Avalanche photodiode (APD). A fill-pattern monitor based on the APD has a bunch-charge resolution of at least 1 part in 10 7.