Abstract
X-states in a circuit design complicate the process of pattern generation and defect detection. X-states complicate the design, verification and testing of advanced ICs. In particular, X-states interfere with test compression, which is becoming a necessity for efficient testing of large devices. Although newer design methods help prevent X-states from occurring in a functional design, many X-states still creep in when real devices are initialised for test, and even more can occur when at-speed testing is performed.
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