Abstract
The variable stripe length method described by Shaklee and Leheny, [Appl. Phys. Lett. 18, 475 (1971)] is a straightforward way to determine the steady-state gain spectrum of laser material. Here, common sources of error are identified and several new, robust ways of calculating the gain from the data are presented. The advantages of these methods are underlined by applying them to data obtained from a Ga(AsSb)∕GaAs∕(AlGa)As heterostructure.
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