Abstract
By using X-ray diffractometry, it was determined how short-term stresses, being within the limits of the offset yield strength σs, influence changes in the diffraction line profile characteristics resulting from static tension in plate specimens of 09G2S (09Г2С) structural steel. Microstructural changes in the surface of 09G2S steel specimens considered in this work were studied at different levels of elastic stress. The special aspects of changes in the diffraction line profile characteristics are presented and discussed, specifically, a broadening of the profile maximum half-width (B), as a response to the external mechanical impact on the surface layers.
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