Abstract
Modifications of the Sawyer-Tower method, based on a measurement of the impedance and Fourier transformations, are proposed. A functional and metrological analysis of the methods is presented, which enables the reliability of the measurements of the field dependences of the parameters of ferroelectric materials to be increased, which should find application in microelectronic and nanoelectronic products.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
