Abstract
1. The strain sensitivity coefficient of silicon semiconductor strain gages makes the accurate measurement of very small displacements feasible, using simple and reliable measuring circuits. 2. The system described provides a means of continously measuring and recording force and displacement with a high degree of accuracy, which is very important in the mechanical testing of structural materials. 3. It is shown that in practice the use of high resistance silicon as the basis for strain gages increases the sensitivity of the measuring systems. 4. It is shown that a material with a high temperature coefficient of resistance can be used for preparing the types of transducers which are used under laboratory conditions.
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