The use of scanning electron microscopy to study the ion beam sputter modification of the surface topography of biological implants

Abstract

One factor which affects the biological tissue response to an implant material is the surface topography of the material. Ion beam sputtering, as a potentially useful roughening technique, has recently been used in attempts to modify the surface topography of biocompatible materials, such as metals, alloys, polymers, and ceramics. The ion-beam sputter modification of the surface topography of three different materials presently used or under consideration for implant devices were studied. A scanning electron microscope was used to examine all the materials tested.