Abstract

AbstractWe have used scanning tunnelling microscopy (STM) to study the surface topography of several materials in the nanometre range. In order to solve some problems of STM, we have integrated it with a conventional scanning electron microscopy (SEM). The aim of this paper is to analyse critically this combination. We emphasize the importance of tip effects in STM, for which purpose we use the image of the tip obtained by SEM. Also, we correlate the images obtained by both techniques in order to gain insight into the operation of both microscopes. In summary, we find that this combination represents an important step in the study of the surface topography of materials of technological interest.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.