The use of a test specification format in automatic test program generation

B Verhelst

doi:10.1109/etc.1989.36264

The use of a test specification format in automatic test program generation

B Verhelst

https://doi.org/10.1109/etc.1989.36264

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Publication Date: Apr 12, 1989

Citations: 14

Affiliation: Philips (Netherlands)

#Automatic Test Program Generation #Automatic Program Generation + Show 8 more

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Abstract

Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By writing a translator from NCF to a test programming language, it was seen that automatic test program generation is possible. It is found, however, that only GO/NOGO test programs could be generated. >

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