Abstract
Quantitative high resolution electron microscopy (HREM) was employed to study the crystallography of a zirconia-alumina transformation-toughening nanolaminate. The nanolaminate consisted of alternating layers of polycrystalline zirconia and amorphous alumina. The zirconia layer thickness was scaled to insure unity volume fraction of the metastable tetragonal phase at the growth temperature, as predicted by an end-point thermodynamics model and verified by x-ray diffraction. In the microscopy sample, phase identification was achieved from precise measurements of lattice spacings using digital diffractograms of individual nanocrystallites. Of the nanocrystallites analyzed, (22±6)% were monoclinic in a distinct crystallographic relationship with their tetragonal neighbors. The following plane and direction relationships were identified: m(100)//t(100) and m[001]//t[001]. The observed structure is the result of a stress-induced transformation from the tetragonal phase. This transformation was localized to nanosized regions within the individual zirconia layers.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
