The thickness evolution of the second-order nonlinear layer in thermally poled fused silica

Abstract

Systematic investigation on the second-order nonlinearity in thermally poled fused silica is reported. The method of the thickness measurement is by fitting the Maker fringe. It is found that the thickness of the second-order nonlinear layer depends on all the poling parameters, not only the poling time, but also the poling temperature and the poling voltage. The thickness of the second-order nonlinear layer increases linearly with the poling time and the poling voltage. The thickness of the second-order nonlinear layer depended on the poling temperature in a function of an Arrhenius plot. A discussion is given on the mechanism of the above evolution.