The Study of Irradiation Effects on Single-chip Microprocessor System under ESD EMP

Abstract

This chapter presents a typical single-chip circuit, which is designed to simulate serial communication interface to study the effect of electrostatic discharge (ESD) electromagnetic pulse (EMP) to single-chip microprocessor (SCM) system. Using the ESD generator, the radiation effect experiments of ESD to the single chip microprocessor (SCM) system are carried out. The chapter provides, analyzes, and discusses the experiment data, which offers gist for studying the measures of protection about SCM system against ESD. Peak value of the current pulse being induced at an ESD event is much higher and the rise time is much quicker, which yields severe electromagnetic interference (EMI) or even damage to the surrounding electronic equipments or electronic system. Thereby, determining their ESD sensibility is very significant, which offers reference and guidance for designing circuit or selecting chip.