A framework for the simulation of electrostatic discharge immunity using the unified circuit modeling technique

Abstract

In this paper, we describe a framework for the accurate estimation of electrostatic discharge (ESD) events induced on realistic products. The framework is based on a unified circuit modeling and simulation technique to deal with the environment of an ESD immunity test including a device under test, a ground strap, and an ESD generator. First, the equivalent circuit model of the ESD generator used in a previous work is improved to achieve more accurate results from simulations. For this purpose, the circuit model is modified by adjusting the circuit parameters and inserting circuit elements. Then, we deal with the ESD events on a printed circuit board (PCB) with a chassis for the practical application of our framework. The PCB and chassis are modeled by using the multilayered finite difference method and excited by the modified circuit model of the generator. The adequacy of our approach is demonstrated by comparing the simulation results with measurement results.