Abstract
The morphology, electronic structure, and optical properties of self-assembled silicon nanostructures grown on the surface of Highly Oriented Pyrolytic Graphite (HOPG) by molecular beam epitaxy were studied by ultra high vacuum (UHV) scanning tunneling microscopy (STM) and X-ray photoemission spectroscopy (XPS) in situ, and by Raman spectroscopy ex situ. At coverages of less than 1 monolayer (ML), the formation of monolayered silicon nanoislands with an atomic structure similar to that of graphene was observed.
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