The structural, electrical properties, and surface morphology of Gd doped LaFeO3 polycrystalline materials

Abstract

The multiferroic materials, specifically Gd-doped LaFeO3, were synthesized using sol–gel processes and characterized using various techniques. The phase purity of the samples was confirmed using both X-ray diffraction (XRD) and Raman spectroscopy with orthorhombic crystal structure and Pbnm space group determined through Rietveld refinement using Fullproof software. SEM analysis was conducted to investigate the surface morphology of the samples, revealing non-uniformly distributed grains. Furthermore, P-E loops were measured to obtain polarization results, providing insights into the ferroelectric properties of the materials. The combination of XRD, Raman spectroscopy, SEM, and P-E loop measurements allowed for a comprehensive characterization of the Gd-doped LaFeO3 samples. These findings contribute to a better understanding of the structural, morphological, and ferroelectric properties of the multiferroic materials, significant implications for the potential applications of these materials in advanced functional devices.