Abstract
Thin layers of tin monosulphide have been grown from equimolar solutions of tin chloride and N,N-dimethyl thiourea on Corning 7059 glass substrates at various temperatures in the range 100-450 °C using spray pyrolysis. The structural properties have been determined by using x-ray diffraction and scanning electron microscopy to evaluate the crystalline phases present and the surface topography of the grown layers. The changes observed in the structural phases with the growth temperature during the film formation are reported and discussed.
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