Abstract
An improved model of the soft X-ray quantum detection efficiency of microchannel plate electron multipliers is presented. The model takes account of the low-energy secondary component of the photoelectric yield and therefore can be used to study microchannel plates bearing high-yield deposition photocathodes such as CsI. Experimental data and theoretical calculations are presented for both front surface and open area contributions to the detection efficiency. The effects of vacuum deposition geometry on the uniformity of response of coated plates are discussed.
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