Abstract
Loss of one electron by singly charged ions is considered as a contrast mechanism for ion microscopy. At high energies, the mean free path for loss is comparable to specimen thicknesses and dependent on specimen atomic number. The ratio of electron loss events to atomic displacements in the specimen decreases with energy, and is estimated to be 500 for 1 MeV helium ions. The energy deposited in a molecule of adenine per electron loss event within the adenine is estimated to be less than 400 eV for 0.6 MeV nitrogen ions. This molecular dose is lower than is required for inelastic scattering of 25 keV electrons from the carbon K shell.
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