The role of x‐ray Swank factor in energy‐resolving photon‐counting imaging

Abstract

Energy-resolved x-ray imaging has the potential to improve contrast-to-noise ratio by measuring the energy of each interacting photon and applying optimal weighting factors. The success of energy-resolving photon-counting (EPC) detectors relies on the ability of an x-ray detector to accurately measure the energy of each interacting photon. However, the escape of characteristic emissions and Compton scatter degrades spectral information. This article makes the theoretical connection between accuracy and imprecision in energy measurements with the x-ray Swank factor for a-Se, Si, CdZnTe, and HgI2-based detectors. For a detector that implements adaptive binning to sum all elements in which x-ray energy is deposited for a single interaction, energy imprecision is shown to depend on the Swank factor for a large element with x rays incident at the center. The response function for each converter material is determined using Monte Carlo methods and used to determine energy accuracy, Swank factor, and relative energy imprecision in photon-energy measurements. For each material, at energies below the respective K edges, accuracy is close to unity and imprecision is only a few percent. Above the K-edge energies, characteristic emission results in a drop in accuracy and precision that depends on escape probability. In Si, and to some extent a-Se, Compton-scatter escape also degrades energy precision with increasing energy. The influence of converter thickness on energy accuracy and imprecision is modest for low-Z materials but becomes important when using high-Z materials at energies greater than the K-edge energies. Accuracy and precision in energy measurements by EPC detectors are determined largely by the energy-dependent x-ray Swank factor. Modest decreases in the Swank factor (5%-15%) result in large increases in relative imprecision (30%-40%).