Abstract
This letter introduces a theory which considers the effect of lossy second-harmonic terminations on the voltage waveform, output power, and efficiency of power amplifiers (PAs) operated in the class-J mode. To this end, the conventional (reactive) class-J mode is extended to a resistive-reactive class-J mode with complex fundamental and second-harmonic load impedances. The theory is experimentally validated by performing on-wafer active load-pull measurements on an AlGaN/GaN HEMT power device with $0.25~\mu{\rm m}$ gate length and a total gate periphery of $6\times 200~\mu{\rm m}$ . The measured waveforms are de-embedded to the internal current-generator of the device, where they exhibit the theoretically predicted behavior.
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