Abstract

Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.