System-level ESD failure analysis depending on source generators

Abstract

System-level ESD test is conducted into laptop using three different ESD generators. It is observed there is a large variation in ESD test result even if the same ESD generator is used. The current waveform from the ESD generator is a unique individual characteristic varies depending on ESD gun manufacturers and it can result in a different ESD test result. The effect of the current waveform is analyzed by comparing waveforms in frequency domain. Apart from current waveform, direct radiation and second radiation are important factors to induce the system-level ESD failure. The influences of the direct and second radiation on ESD test are analyzed by a shield effect experiment. In order to prevent the ESD failure due to the direct and second radiation, system manufacturers should design their structure as well-shielded by an anti-static case.