Abstract
The radiation test of a commercial 16 bit-MPU was conducted for the application to the onboard computers of small satellites. This MPU is commercially available and equipped with flash EEPROM, SRAM (4 kbyte), A/D-D/A converter, serial communication interface and peripheral I/O functions. To predict the error rate by the radiation in space environment, a preliminary test was conducted using a Californium-252 radio isotope source at National Space Development Agency of Japan (NASDA), and the tolerance of the MPU was confirmed. As a next step, a radiation test using a large accelerator was conducted at Japan Atomic Energy Research Institute (JAERI), and the error rates of SEU (Single Event Upset) and SEL (Single Event Latch-up) were evaluated precisely. The calculated result by CREME software showed relatively low rates of SEU and SEL in the space environment of the orbit at an altitude of 450 km.
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