Study of SEL and SEU in SRAM using different laser techniques

Abstract

Single event upset (SEU) and single event latchup (SEL) laser testing results of SRAM CY62256 using both focused and local laser irradiation techniques are presented. Variable laser wavelength was used for SEU and SEL threshold linear energy transfer (LET) estimation. The backside laser irradiation technique was also applied. Laser testing results were compared to heavy ion testing ones. depends on SEE type and the laser irradiation technique being used. We investigated SEL and SEU effects in SRAM CY62256NLL using focused and local laser irradiation techniques and different laser wavelengths (1.064, 1.0, 0.9 and 0.85 μm). We also used the backside laser irradiation in addition to the front side one when making the experiment with the wavelength of 1.064 μm. II. EXPERIMENTAL TECHNIQUE The experimental investigation was carried out using two laser facilities providing the wavelengths from 0.53 μm up to 1.064 μm (Table 1). In this work PICO-3 laser facility was used at 1.064 μm wavelength. PICO-4 operated at the wavelengths of 1.0 μm, 0.9 μm and 0.85 μm.