Abstract

Recent experiments on the interaction of proton beams with solids have shown that the regular variations of intensity in the spatial distribution of the scattered beam was dependent on the regular nature of the crystalline lattice. This phenomenon has been exploited in an apparatus which may be applied to the orientation and examination of single crystals and thin crystalline films. In the proton scattering microscope to be described, a beam of protons is directed on to the crystal under investigation and the scattered beam is observed directly on a fluorescent screen.

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