The problem of correlating Schottky-diode barrier height with an ideality factor using I-V measurements

Abstract

Critical analysis is made of a recently proposed method of determining the relationship between the ideality factor and the barrier height of Schottky barrier diodes (SBD's) from I-V measurements. It is demonstrated that, while this method may produce consistent results in situations where a stable reproducible manufacturing process exists, the flat-band barrier height so determined cannot be taken to be the true flat-band barrier height.