Abstract
In this article a method is presented for evaluating the probability of detecting (PD) a single stuck-fault in a sequential circuit as a function of the number of random input test vectors. A discrete parameter Markov-model is used in the analysis to obtain closed-form expressions for PD. The circuit is partitioned into three parts, the input and output combinational logic and the memory. The analysis is based upon the stationary-state transition matrix associated with a circuit, and the probability that a fault in one of the partitions produces an error at the output of that partition when a random input vector is applied. Results are presented to show how this problem can be reduced to that of testing an equivalent combinational circuit.
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