Abstract
We researched microstructure and I-V characteristics of step-edge Josephson junctions in YBa2Cu3O7(YBC0) films grown on shallow steps with angles of 19° in MgO(100) substrates. At upper step-edges with a clear edge, one distinct grain boundary is observed. However at lower edges with a gentle slope, no grain boundary is formed near the substrate but a pure tilt boundary started growing above 30nm. The sample shows the typical I-V characteristics of a superconductor-normal-superconductor(SNS) Josephson junction. It is suggested that only one Josephson junction at the upper edge is fabricated in our step edge junctions. To improve reproducibility of junction properties, control of boundary growth is necessary because the shape of boundary changes easily.
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