Abstract
We have considered the possibility of measuring the linear and quadratic (in magnetic field) magnetooptical effects in magnetooptical crystals that are simultaneously exposed to a constant (polarizing) magnetic field and to an alternating magnetic field under conditions of magnetomechanical resonance. The use of a Mueller polarimeter in combination with spectral analysis of the intensity of the light wave at the output of the polarimeter makes it possible to selectively determine elements of the Mueller matrix and minimize the amount of measurements. We have shown that there is a possibility of solving the inverse problem on finding two components of the alternating magnetic field in which a magnetooptical crystal is placed.
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