The photoelastic coefficient {P}_{12} of H+ implanted GaAs as a function of defect density

Andrey Baydin,Rustam Gatamov,Joy Garnett,Halina Krzyzanowska,Norman Tolk

doi:10.1038/s41598-017-14903-x

Andrey Baydin, Rustam Gatamov + Show 3 more

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https://doi.org/10.1038/s41598-017-14903-x

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Journal: Scientific Reports	Publication Date: Nov 9, 2017
Citations: 8	License type: open-access

Affiliation: Vanderbilt University

Abstract

The photoelastic phenomenon has been widely investigated as a fundamental elastooptical property of solids. This effect has been applied extensively to study stress distribution in lattice-mismatched semiconductor heterostructures. GaAs based optoelectronic devices (e.g. solar cells, modulators, detectors, and diodes) used in space probes are subject to damage arising from energetic proton (H+) irradiation. For that reason, the effect of proton irradiation on photoelastic coefficients of GaAs is of primary importance to space applied optoelectronics. However, there yet remains a lack of systematic studies of energetic proton induced changes in the photoelastic properties of bulk GaAs. In this work, the H+ energy and fluence chosen for GaAs implantation are similar to that of protons originating from the radiation belts and solar flares. We present the depth-dependent photoelastic coefficient {P}_{12} profile in non-annealed H+ implanted GaAs obtained from the analysis of the time-domain Brillouin scattering spectra. The depth-dependent profiles are found to be broader than the defect distribution profiles predicted by Monte Carlo simulations. This fact indicates that the changes in photoelastic coefficient {P}_{12} depend nonlinearly on the defect concentrations created by the hydrogen implantation. These studies provide insight into the spatial extent to which defects influence photoelastic properties of GaAs.

Highlights

The photoelastic phenomenon has been widely investigated as a fundamental elastooptical property of solids
An incoming femtosecond pump pulse generates a coherent acoustic phonon wave which is a picosecond strain wave traversing the material at the speed of sound
We have demonstrated that time-domain Brillouin scattering (TDBS) can be applied to measure depth profiles of photoelastic coefficients in hydrogen ion bombarded Gallium arsenide (GaAs)

Summary

Introduction

The photoelastic phenomenon has been widely investigated as a fundamental elastooptical property of solids This effect has been applied extensively to study stress distribution in lattice-mismatched semiconductor heterostructures. The depth-dependent profiles are found to be broader than the defect distribution profiles predicted by Monte Carlo simulations This fact indicates that the changes in photoelastic coefficient P12 depend nonlinearly on the defect concentrations created by the hydrogen implantation. Compressed at megabar pressures[19,20] doping profiles[21], distribution of stress[22], imaging of grain microstructure[23], and determination of laser-induced temperature gradients in liquids[24] We applied this technique to determine depth profiles of the complex refractive index modification arising from H+ implantation in 4H-SiC25. The field of ion implanted semiconductors suffers from a lack of knowledge of the dependence of photoelastic coefficients on defect density

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Conclusion