Abstract
Ta 3Ge transforms from a high temperature form h-Ta 3Ge (Fe 3P-type structure, space group I 4 ̄ , Z = 8) into a low temperature form l-Ta 3Ge (Ti 3P-type structure, space group P4 2/ n, Z = 8) on annealing at temperatures below 1550 °C. Previous studies using X-ray diffraction and optical microscopy have indicated that the transition occurs through a shear mechanism which permits the atomic rearrangement to take place without breaking the contiguity of the lattice for the two Ta 3Ge structures. In the present investigation the transition was examined by X-ray powder diffraction methods, paying particular attention to the variations in the intensity and the line broadening of reflections with an odd value of h + k + l. The crystallographic data for the l-Ta 3Ge structure and estimates of the relative amounts of h-Ta 3Ge and l-Ta 3Ge in various samples were determined from a Rietveld-type full profile analysis of Guinier-Hägg X-ray powder diffraction film intensity data. Closer analysis of the variation in line broadening for reflections with odd values of h + k + l provided further evidence in support of the transformation mechanism proposed earlier.
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