Abstract
We theoretically designed the Kretschmann configuration coupled plasmon-waveguide resonance (CPWR) sensors, composed of thin films of metal nitrides. The thicknesses of the layers of the CPWR sensors were optimized using a genetic algorithm. The optimized CPWR sensors were applied to simultaneously measure the thickness and refractive index (RI) of diamond-like carbon (DLC) films. The field profiles and the sensitivity of the CPWR sensors in response to thin DLC films were studied using the finite-different time-domain technique and the transfer matrix method. The genetic algorithm method predicted that the two-mode CPWR sensors could simultaneously analyze the thickness and RI of the DLC films as thin as 1.0 nm at a wavelength of 1550 nm. The simulations showed that the angular sensitivity toward the refractive index changes of the DLC films of the optimized CPWR sensors was comparable to that of traditional CPWR sensors.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
