The Microcamera Used for Photoelectron Excited by the X‐ray Standing Wave (XSW) Recording and Submicron Layer Structure Studies

Abstract

AbstractInformation obtained owing to aquaintance with the course of the angular dependence of photoelectron intensity excited by the X‐ray standing waves allows to determine, more explicitly, the state of crystal surface layer deformation. The aim of this work is to present a new measuring device constructed at the Institute of Physics of the Polish Academy of Sciences, especially the X‐ray microcamera being simultaneously the proportional flowing counter used for measuring of photoelectron current emitted from the examined crystal. The angular dependence of the photoelectron current can be measured in coincidence with the angular running of rocking‐curves. It is possible due to a computer program controlling the X‐ray doble‐crystal spectrometer, the microcamera and the electronic system for registration of the intensity of the diffracted beam as well the flowing counter.The scheme of the X‐ray double‐crystal spectrometer, the microcamera, and the electronic measuring system operation is given. There are also given the results of the introductory measurements carried out for the Si(111) implanted with the Au ions. The calculation of rocking‐curve for non‐disturbed crystal in the case of asymmetrically cut monochromator crystal was made. There was also estimated the range of depth from that the photoelectrons were emitted.