Abstract
AbstractInformation obtained owing to aquaintance with the course of the angular dependence of photoelectron intensity excited by the X‐ray standing waves allows to determine, more explicitly, the state of crystal surface layer deformation. The aim of this work is to present a new measuring device constructed at the Institute of Physics of the Polish Academy of Sciences, especially the X‐ray microcamera being simultaneously the proportional flowing counter used for measuring of photoelectron current emitted from the examined crystal. The angular dependence of the photoelectron current can be measured in coincidence with the angular running of rocking‐curves. It is possible due to a computer program controlling the X‐ray doble‐crystal spectrometer, the microcamera and the electronic system for registration of the intensity of the diffracted beam as well the flowing counter.The scheme of the X‐ray double‐crystal spectrometer, the microcamera, and the electronic measuring system operation is given. There are also given the results of the introductory measurements carried out for the Si(111) implanted with the Au ions. The calculation of rocking‐curve for non‐disturbed crystal in the case of asymmetrically cut monochromator crystal was made. There was also estimated the range of depth from that the photoelectrons were emitted.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.