Abstract
Reheat or stress relief cracking phenomena have been reassessed in 2.25Cr1.5W heat-resistant alloys. During rupture test, time to intergranular failure increases with decreasing temperature and tensile stress and is shorter in the alloy containing a higher bulk content of phosphorus. Also the time to intergranular failure can be expressed by t=t0·σ−n·exp(Q/RT) where t0 is the proportional constant, n the stress exponent and Q the activation enthalpy. Matrix softening is accelerated under tensile stress and an active carbide growth occurs at grain boundaries oriented normal to the tensile stress direction. Because impurities segregate actively to dimples frequently observed at reheat intergranular fracture surfaces, the dimples are not micro-ductile fracture areas but the grain boundary carbide interfaces. The segregation concentration of the impurities is much higher at the grain boundary carbide interfaces than the carbide-free grain boundaries. The phosphorus segregation at the carbide interfaces of the alloy containing the higher bulk content of phosphorus is mainly replaced by the segregation of nitrogen, tin and tellurium in the alloy containing a lower bulk content of phosphorus. The elevated temperature intergranular cracking under tensile stress occurs finally due to the carbide-free grain boundary cracking following the decohesion of the grain boundary carbide interfaces.
Published Version
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