The measurement of orientation distribution and its application to quantitative X-ray diffraction analysis

Abstract

AbstractUsing X-ray techniques, the orientation distributions of crystal planes in laboratory prepared and naturally occurring aggregates were measured. A small specimen was mounted on the axis of a goniometer and the diffracted intensity measured as the specimen was rotated. Mo radiation was used to reduce the absorption effects. A mathematical relation between the distribution of particles and the distribution of crystal planes was derived for platy and fibrous particles in flake-like and rod-shaped specimens.When diffracted intensities of the 001 reflection of several different kaolinites were corrected for the degree of orientation in the respective specimens, a constant value was obtained. This would enable quantitative diffraction analyses to be made without the large errors that can be introduced by orientation effects. The degree of particle orientation achieved appeared to be more dependent on particle morphology than on the method of sample preparation or formation.