Abstract
The Model 700 scanning electron microscope is a high resolution instrument which incorporates the same basic modular concept that has proven so satisfactory in the Materials Analysis Company Model 400 x-ray microprobe and its latest development, the Model 400S. The instrument described here is the basic building block to which accessories such as additional display tubes, special specimen holders, etc., can be easily added.The electron-optical column consists of a triode electron gun, double electromagnetic condenser lens, and objective lens. A .004″ tungsten hairpin filament is used as the electron source, and the filament to grid spacing is externally adjustable during operation to optimize gun performance for all operating conditions. The double condenser system is unitized and uses a single energizing coil. An adjustable multiple aperture holder is provided between the double condenser lens system and the objective lens, which serves to define the convergence angle of the probe in the specimen plane.
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