The kick-out mass selection technique for ions stored in an Electrostatic Ion Beam Trap

Abstract

A simple mass selection technique which allows one to clean a keV ion beam of undesirable masses while stored in an Electrostatic Ion Beam Trap (EIBT) is described. The technique is based on the time-of-flight principle and takes advantage of the long storage times and self-bunching that are possible in this type of traps (self bunching being the effect that keeps ions of the same mass bunched in spite of their finite distributions of velocities and trajectories). As the oscillation period is proportional to the square root of the ion mass, bunches containing ions of different masses will separate in space with increasing storage time and can be kicked out by a pulsed deflector mounted inside the trap. A mass selector of this type has been implemented successfully in an EIBT connected to an Even-Lavie supersonic expansion source and is routinely used in ongoing cluster experiments.