Abstract
We report our investigations to eliminate the bias dependency of quantum efficiency of nBn devices based on InGaAsSb bulk alloy aimed for extended short wavelength detection. Both a p-type doped AlGaSb barrier and a p-type doped top contact layer were employed. The 9 × 1015cm-3p-type doping of AlGaSb barrier slightly improves the bias dependency of quantum efficiency of nBn devices. The using of p-type doped top contact layer completely eliminated the band offset induced bias dependency of quantum efficiency and a 2.2% variation of quantum efficiency as applied reverse bias increases was discussed in terms of the effect of surface depletion region and junction depletion region.
Published Version
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