Abstract
We discuss the influence of a depressed order parameter at the surface of a high-Tc superconductor on the temperature dependence of the Josephson critical current in SIS′ and SIS junctions, where S denotes the high-Tc superconductor, S′ a conventional one, and I the insulating layer. The comparison with experimental data of planar YBCO-based SIS′ and SIS junctions shows that, when the quality of the junction interfaces is particularly good, the fit by using the depressed-gap models can accurately reproduce the experimental Ic(T) curves. As a consequence, the surface depression of the order parameter is the most plausible cause for the intrinsic deviations of the IcRN products from the ideal BCS values in this kind of junctions.
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