Abstract

The fundamental objective of the problem is a comprehensive study of the internal structure of microprocessors for industrial microelectronics, design technology to ensure VLSI efficiency at extremely high temperature levels with external destructive factors. Based on the data we have studied, the main problem of choosing optimal structural solutions for industrial systems based on them, providing the best resistance and fault tolerance of memory and microprocessors under difficult operating conditions, requires a preliminary comparative analysis of various schemes and functional solutions used for IP blocks.

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