Abstract
The accurate measurement of the output parameters of photovoltaic (PV) cells is a key step in building a PV system. The output parameters of a PV cell under actual test conditions will appear different degrees of the deviation from those under the standard test conditions. In this work, we are primarily concerned with the deviations of the temperature distributions and output parameters of a testing c-Si solar cell caused by the heat transfer process under actual test conditions. The results show that the temperature distributions of c-Si solar cells under actual test conditions will be uneven and obviously deviate from those under the standard test conditions; the heat transfer coefficients at the interfaces between the front surface and environmental air and between the back surface and mental holder have important consequences for the temperature distributions of c-Si solar cells; under the actual test conditions of PV enterprises, the possible deviation range of short-circuit current density, open-circuit voltage, filling factor, and efficiency may be from −17 to 9 µA/cm2, from −11 to 17 mV, from −0.4% to 0.7%, and from −0.4% to 0.7%, respectively.
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