Abstract
Image patterns formed by low voltage aberration-corrected high resolution transmissionelectron microscopy (HRTEM) of few layer graphene provide insight into the number oflayers present. For odd numbers of graphene layers (three layers or more) and evennumbers of graphene layers, distinctly different image patterns are produced. Asheet with step edges of between zero, one, two and three layers of graphene isfabricated using in situ electron beam sputtering at 80 kV and atomic resolutionimages are obtained. A correlation between the theoretically generated imagesimulations and the real HRTEM images is found and this enables us to distinguishbetween monolayer, bilayer, and trilayer graphene using image pattern recognition.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
