Abstract
Delayed electroluminescence (EL) measurements are used to investigate electroluminescence stability in phosphorescent organic light emitting devices (PHOLEDs) containing typical hole blocking layers (HBLs). The results show a strong correlation between the extent of hole blockage capacity of the HBL and the rate of deterioration in device EL efficiency, pointing to the major role that the build-up of hole space charges in the emitting layer (EML) plays in EL degradation. In this regard, the use of a strongly blocking material significantly increases the build-up of holes in the EML, and accelerates EL degradation.
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