Abstract
ABSTRACT The influence of stress on the spontaneous polarization in two-dimensional Bi4Ti3O12 (BiT) films is investigated by modified Landau—Devonshire thermodynamic theory. Three orientation cases of BiT unit, nine ferroelectric phases are discussed under the mechanism of strain-polarization coupling. Results show that the effect of stress on out-of-plane spontaneous polarization for all cases is small and can not clarify the origin of the effect of external stress on the net-switched charge in Nd- and La-doped Bi4Ti3O12 films. So there is a need to consider stress-induced reorientation of domains.
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