Abstract
The effects of the titanium implantation depth on the wear behaviour of two different silicon-nitride-based engineering ceramics with different binding phase compositions are investigated. Implantation energies were 150, 400, 1000 and 2000 keV, corresponding to projected implantation ranges from about 100 nm to 1100 nm as predicted by trim simulations. The fluence was 10 17 Ti + ions cm −2 in all cases. X-ray diffraction was used in order to determine the degree of amorphization of the near-surface region due to implantation. No titanium-containing phases have been detected. Wear tests were performed at room temperature with an oscillating ball-on-disc type tribometer. The wear tracks were subsequently investigated using surface profilometry and energy-dispersive X-ray spectroscopy. The wear is reduced for all implanted samples. The influence of the implantation depth on the wear behaviour and the relationship between the friction coefficient and the observed wear are discussed.
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