Abstract
Co/Cu multilayer films with and without Fe buffer layer are prepared in a sputtering system for the investigation of the influence of interface roughness on the giant magnetoresistance of these films. The magnetoresistance measurements are carried out at room temperature by a standard four-point probe method. It turned out that the well-known oscillatory character of the giant magnetoresistance as a function of Cu interlayer thickness is different for the system without buffer layer in comparison to that with a 6 nm Fe buffer layer. Structural investigations by transmission electron microscopy and X-ray diffraction reveal rough interfaces and a disturbed structure of the layer system for the films without buffer layer. This is assumed to be the reason for the observed different oscillatory behaviour.
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